JPH0648405Y2 - 表面低抗測定用探触子 - Google Patents
表面低抗測定用探触子Info
- Publication number
- JPH0648405Y2 JPH0648405Y2 JP1985071796U JP7179685U JPH0648405Y2 JP H0648405 Y2 JPH0648405 Y2 JP H0648405Y2 JP 1985071796 U JP1985071796 U JP 1985071796U JP 7179685 U JP7179685 U JP 7179685U JP H0648405 Y2 JPH0648405 Y2 JP H0648405Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- contactor
- ring
- spring
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985071796U JPH0648405Y2 (ja) | 1985-05-14 | 1985-05-14 | 表面低抗測定用探触子 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985071796U JPH0648405Y2 (ja) | 1985-05-14 | 1985-05-14 | 表面低抗測定用探触子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61187465U JPS61187465U (en]) | 1986-11-21 |
| JPH0648405Y2 true JPH0648405Y2 (ja) | 1994-12-12 |
Family
ID=30609608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985071796U Expired - Lifetime JPH0648405Y2 (ja) | 1985-05-14 | 1985-05-14 | 表面低抗測定用探触子 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0648405Y2 (en]) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102410822B (zh) * | 2010-09-21 | 2013-07-24 | 捷毅系统股份有限公司 | 厚度量测装置及其方法 |
| CN109596677A (zh) * | 2018-11-02 | 2019-04-09 | 大族激光科技产业集团股份有限公司 | 一种质量检测装置、方法、系统及一体式探针组件 |
| KR102352319B1 (ko) * | 2018-11-02 | 2022-01-17 | 한스 레이저 테크놀러지 인더스트리 그룹 컴퍼니 리미티드 | 품질 검사 장치, 방법, 시스템 및 일체형 프로브 어셈블리 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5287943U (en]) * | 1975-12-25 | 1977-06-30 | ||
| JPS6169165U (en]) * | 1984-10-11 | 1986-05-12 |
-
1985
- 1985-05-14 JP JP1985071796U patent/JPH0648405Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61187465U (en]) | 1986-11-21 |
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